Cite this article as:

Yerokhin P. S., Utkin D. V., Kuznetsov O. S., Konnov N. P., Aspen N. A. Application of Atomic Force Microscopy for Detection of Influence of Antibiotic Upon the Microbial Cell (on the Model of E.coli and I Generation Cephalosporins). Izvestiya of Saratov University. New series. Series Physics, 2013, vol. 13, iss. 2, pp. 28-33. DOI: https://doi.org/10.18500/1817-3020-2013-13-2-28-33

Heading: 
Physics
UDC: 
579.23:53.086:615.281
Language: 
Russian

Application of Atomic Force Microscopy for Detection of Influence of Antibiotic Upon the Microbial Cell (on the Model of E.coli and I Generation Cephalosporins)

Authors: 
Yerokhin Pavel Sergeevich, Russian Research AntiPlague Institute «Microbe» (Saratov), 46, Universitetskaya Str., Saratov, Saratov region, 410005, Russia, rusrapi@microbe.ru
Utkin Denis Valerievich, Russian Research AntiPlague Institute «Microbe» (Saratov), 46, Universitetskaya Str., Saratov, Saratov region, 410005, Russia, rusrapi@microbe.ru
Kuznetsov Oleg S., Russian Research AntiPlague Institute «Microbe» (Saratov), 46, Universitetskaya Str., Saratov, Saratov region, 410005, Russia, rusrapi@microbe.ru
Konnov Nicholas Pavlovich, RUSSIAN RESEARCH antiplague Institute «MICROBE», Saratov, University street, d. 46, rusrapi@microbe.ru
Aspen Natalia Alexandrovna, RUSSIAN RESEARCH antiplague Institute «MICROBE», Saratov, University street, d. 46, rusrapi@microbe.ru
Abstract

Alteration of E.coli cell wall caused by Cefazolin-AKOS was observed atomic force microscopy (AFM). Using semi-contact and contact modes the damaging effect of the Cefazolin-AKOS antibiotic was shown after a 30 minutes exposure. The assessment of physical parameters of cell allow to get more detailed information on the effect of antibiotics on microorganisms.

Key words: 
АСМ, полуконтактный режим, контактный режим, микроорганизмы, антибактериальные препараты, шероховатость, сила адгезии, распределение латеральных характеристик, чувствительность
DOI: 
https://doi.org/10.18500/1817-3020-2013-13-2-28-33
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