The method of digital speckle photography for determining of speckle pattern displacement with sub-pixel accuracy using correlation processing of summary spatial spectrum of speckle patterns is considered in this article. It is assumed that displacement of speckle pattern is caused by deformation or displacement of an object with a scattering surface. The method of phase shift of interference pattern in diffraction halo is proposed for expanding the lower limit of measuring range of speckle pattern displacement to subpixel values.